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Thomas Wilhein

Prof. Dr. rer. nat. Thomas Wilhein

FB Mathematik, Informatik, Technik, Hochschule Koblenz

Joseph-Rovan-Allee 2, 53424 Remagen, Raum: RheinAhrCampus, C  220

  • 02642/932-203
  • 02642/932-399
Publikationen
Ergebnisse pro Seite:  10

Schäfer, David; Benk, Markus; Bergmann, Klaus et al.

Optical setup for tabletop soft X-ray microscopy using electrical discharge sources

Journal of Physics : Conference Series. Bd. 186. H. 1. Bristol: IOP Publ. 2009 012033


Gutt, Christian; Stadler, Lorenz-M.; Streit-Nierobisch, Simone et al.

Resonant magnetic scattering with soft x-ray pulses from a free-electron laser operating at 1.59 nm

Physical review : B ; condensed matter and materials physics. Bd. 79. H. 21. College Park, MD: APS 2009 212406


Bertilson, Michael C.; von Hofsten, Olov; Lindblom, Magnus et al.

Compact high-resolution differential interference contrast soft x-ray microscopy

Applied Physics Letters. Bd. 92. H. 6. Melville, N.Y.: AIP Publishing 2008 064104


Benk, Markus; Bergmann, Klaus; Schäfer, David et al.

Compact soft x-ray microscope using a gas discharge light source

Optics Letters. Bd. 33. H. 20. Washington, DC. 2008 S. 2359 - 2361


Schäfer, David; Nisius, Thomas; Früke, Rolf et al.

Compact x-ray microscopes for EUV- and soft x-radiation with spectral imaging capabilities

Advances in X-Ray/EUV Optics, Components and Applications. Bd. 6317. Bellingham, Wash.: SPIE 2007 631704


Lindblom, Magnus; Tuohimaa, Tomi; Holmberg, Anders et al.

High-resolution differential interference contrast X-ray zone plates : design and fabrication

Spectrochimica Acta, Part B : Atomic Spectroscopy. Bd. 62. H. 6-7. Amsterdam: Elsevier 2007 S. 539 - 543


Nisius, Thomas; Schäfer, David; Früke, Rolf et al.

Wavefront analysis and beam profiling from 40 eV up to 40 keV

Advances in X-Ray/EUV Optics, Components and Applications. Bd. 6317. Bellingham, Wash.: SPIE 2007 6317E


Vogt, Ulrich; Lindblom, Magnus; Charalambous, Pambos et al.

Condenser for Koehler-like illumination in transmission x-ray microscopes at undulator sources

Optics Letters. Bd. 31. H. 10. Washington, DC: Soc. 2006 S. 1465 - 1467


Vogt, Ulrich; Wilhein, Thomas; Legall, Herbert et al.

High-Resolution X-Ray Absorption Spectroscopy Using a Laser Plasma Radiation Source

Aoki, Sadao (Hrsg). Proceedings of the 8th International Conference on X-ray microscopy. Tokio: IPAP : Institute of Pure and Applied Physics 2006 S. 334 - 336


Vogt, Ulrich; Lindblom, Magnus; Jansson, Per A. C. et al.

Towards Soft X-Ray Phase-Sensitive Imaging with Diffractive Optical Elements

Aoki, Sadao (Hrsg). Proceedings of the 8th International Conference on X-ray microscopy. Tokio: IPAP : Institute of Pure and Applied Physics 2006 S. 91 - 93