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Thomas Wilhein

Prof. Dr. rer. nat. Thomas Wilhein

FB Mathematik, Informatik, Technik, Hochschule Koblenz

Joseph-Rovan-Allee 2, 53424 Remagen, Raum: RheinAhrCampus, C  220

  • 02642/932-203
  • 02642/932-399
Publikationen
Ergebnisse pro Seite:  10

Wieland, Marek; Wilhein, Thomas; Spielmann, Christian et al.

Towards Table-Top Time-Resolved Soft X-Ray Microscopy Imaging With a Laboratory High-Harmonic Source at 100 eV

Aoki, Sadao (Hrsg). Proceedings of the 8th International Conference on X-ray microscopy. Tokio: IPAP : Institute of Pure and Applied Physics 2006 S. 369 - 371


Kaulich, Burkhard; Bacescu, Daniel; Susini, Jean et al.

TwinMic : a European Twin X-ray Microscopy Station Comissioned at ELETTRA

Aoki, Sadao (Hrsg). Proceedings of the 8th International Conference on X-ray microscopy. Tokio: IPAP : Institute of Pure and Applied Physics 2006 S. 22 - 25


Früke, Rolf; Kutzner, Jörg; Witting, Tobias et al.

EUV scanning transmission microscope operating with high-harmonic and laser plasma radiation

epl : a letters journal exploring the frontiers of physics. Bd. 72. H. 6. Les Ulis: EDP Sciences 2005 S. 915 - 921


Di Fabrizio, Enzo; Cojoc, Dan; Cabrini, Stefano et al.

Phase and intensity control through diffractive optical elements in X-ray microscopy

Journal of Electron Spectroscopy and Related Phenomena : the international journal on theoretical, experimental and applied aspects of electron spectroscopy. Bd. 144-147. New York [u.a.]: Elsevier 2005 S. 957 - 961


Vogt, Ulrich; Lindblom, Magnus; Jansson, Per A. C. et al.

Single optical element soft x-ray interferometer using a laser plasma x-ray source

Optics Letters. Bd. 30. H. 16. Washington, DC: Soc. 2005 S. 2167 - 2169


Wieland, Marek; Spielmann, Christian; Westerwalbesloh, Thomas et al.

Toward time-resolved soft x-ray microscopy using pulsed fs-high-harmonic radiation

Ultramicroscopy. Bd. 102. H. 2. Amsterdam: Elsevier Science 2005 S. 93 - 100


Wieland, Marek; Wilhein, Thomas; Kleineberg, Ulf et al.

Applications of high-harmonic radiation for interferometry and spectroscopy

Krausz, Ferenc (Hrsg). Ultrafast Optics IV. Berlin [u.a.]: Springer 2004 S. 467 - 474


Vogt, Ulrich; Wilhein, Thomas; Legall, Herbert et al.

High resolution x-ray absorption spectroscopy using a laser plasma radiation source

Review of Scientific Instruments. Bd. 75. H. 11. Melville, NY: AIP 2004 S. 4606 - 4609


Vogt, Ulrich; Frueke, Rolf; Wilhein, Thomas et al.

High-resolution spatial characterization of laser produced plasmas at soft x-ray wavelengths

Applied Physics : B ; Lasers and optics. Bd. 78. H. 1. Berlin [u.a.]: Springer 2004 S. 53 - 58


Di Fabrizio, Enzo; Cojoc, Dan; Cabrini, Stefano et al.

Design and Fabrication of new optics for X-ray microscopy and material sciences

Journal de Physique IV : Proceedings. Bd. 104. H. 3. Les Ulis: EDP Sciences 2003 S. 177 - 183