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Thomas Wilhein

Prof. Dr. rer. nat. Thomas Wilhein

FB Mathematik, Informatik, Technik, Hochschule Koblenz

Joseph-Rovan-Allee 2, 53424 Remagen, Raum: RheinAhrCampus, C  220

  • 02642/932-203
  • 02642/932-399
Publikationen
Ergebnisse pro Seite:  10

Wilhein, Thomas

Investigations on Laser-Generated Plasma Sources

Thieme, Jürgen (Hrsg). X-Ray Microscopy and Spectromicroscopy : Part V. Berlin [u.a.]: Springer 1998 S. 373 - 383


Lebert, R; Schriever, G; Wilhein, Thomas et al.

Soft x-ray emission of laser-produced plasmas using a low-debris cryogenic nitrogen target

Journal of Applied Physics. Bd. 84. H. 6. Melville, NY: American Institute of Physics 1998 S. 3419 - 3421


Wilhein, Thomas; Altenbernd, D.; Teubner, U. et al.

X-ray brilliance measurements of a subpicosecond laser plasma using an elliptical off-axis reflection zone plate

Journal of the Optical Society of America : JOSA ; B : Optical physics. Bd. 15. H. 3. Washington, DC: Optical Society of America 1998 S. 1235 - 1241


Fiedorowicz, Henryk; Bartnik, Andrzej; Jarocki, Roman et al.

X-ray emission in the ‘water window’ from a nitrogen gas puff target irradiated with a nanosecond Nd:glass laser pulse

Applied Physics : B ; Lasers and optics. Bd. 67. H. 3. New York [u.a.]: Springer 1998 S. 391 - 393


Wilhein, Thomas; Hambach, D.; Niemann, Bastian et al.

Off-axis reflection zone plate for quantitative soft x-ray source characterization

Applied Physics Letters. Bd. 71. H. 2. Woodbury, NY: American Institute of Physics 1997 S. 190 - 192


Niemann, Bastian; Wilhein, Thomas; Schliebe, T. et al.

A special method to create gratings of variable line density by low voltage electron beam lithography

Microelectronic Engineering : an international journal of semiconductor manufacturing technology. Bd. 30. H. 1-4. Amsterdam: Elsevier Science 1996 S. 49 - 52


Schneider, Gerd; Wilhein, Thomas; Niemann, Bastian et al.

X-ray microscopy with high-resolution zone plates : recent developments

Proceedings of SPIE : X-Ray Microbeam Technology and Applications. Bd. 2516. Bellingham, Wash.: SPIE 1995 S. 90 - 101


Thieme, Jürgen; Wilhein, Thomas; Guttmann, Peter et al.

Direct Visulization of Iron+ Manganese Accumulating Microorganisms by X-Ray Microscopy

Aristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 152 - 156


Schmahl, Günther; Rudolph, Dietbert; Niemann, Bastian et al.

Natural imaging of biological specimens with X-ray microscopes

Chance, Britton (Hrsg). Synchrotron radiation in the biosciences. Oxford [u.a.]: Clarendon Press 1994 7.1


Schmahl, Günter; Guttmann, Peter; Schneider, Gerd et al.

Phase Contrast Studies of Hydrated Specimen with the X-Ray Microscope at BESSY

Aristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 196 - 206