Prof. Dr. rer. nat. Thomas Wilhein
FB Mathematik, Informatik, Technik, Hochschule Koblenz
- 02642/932-203
- 02642/932-399
Wilhein, Thomas; Kaulich, Burkhard; Di Fabrizio, Enzo et al.
Differential Interference Contrast X-ray Microscopy at ESRF Beamline ID 21Journal de Physique IV : Proceedings. Bd. 104. H. 3. Les Ulis: EDP Sciences 2003 S. 535 - 541
Di Fabrizio, Enzo; Cojoc, Dan; Cabrini, Stefano et al.
Diffractive optical elements for differential interference contrast x-ray microscopyOptics Express. Bd. 11. H. 19. Washington, DC: Soc. 2003 S. 2278 - 2288
Wieland, Marek; Früke, Rolf; Wilhein, Thomas et al.
Hohe Harmonische im EUV : Charakterisierung und erste AnwendungenBuzug, Thorsten M. (Hrsg). Physikalische Methoden der Laser- und Medizintechnik. Düsseldorf: VDI-Verl. 2003 S. 260 - 266
Früke, Rolf; Wilhein, Thomas; Wieland, Marek et al.
Imaging of a laser plasma source at 13 nm wavelength approaching submicrometer resolutionJournal de Physique IV : Proceedings. Bd. 104. H. 3. Les Ulis: EDP Sciences 2003 S. 153 - 156
Di Fabrizio, Enzo; Cojoc, Dan; Cabrini, Stefano et al.
Nano-optical elements fabricated by e-beam and x-ray lithographyProceedings of SPIE : Nano- and Micro-Optics for Information Systems. Bd. 5225. Bellingham, Wash.: SPIE 2003 S. 113 - 125
Buzug, Thorsten M.; Hartmann, Ulrich; Hülster, Anke et al.
Fortschrittberichte VDI. Physikalische Methoden der Laser- und MedizintechnikDüsseldorf: VDI-Verl. 2003 310 S. (Reihe 17 : Biotechnik, Medizintechnik ; 231)
Di Fabrizio, Enzo; Cabrini, Stefano; Cojoc, Dan et al.
Shaping X-rays by diffractive coded nano-opticsMicroelectronic Engineering : an international journal of semiconductor manufacturing technology. Bd. 67-68. H. 1. Amsterdam: Elsevier 2003 S. 87 - 95
Wieland, Marek; Früke, Rolf; Wilhein, Thomas et al.
Sub-micron imaging in the EUV-spectral range using high-harmonic radiationJournal de Physique IV : Proceedings. Bd. 104. H. 3. Les Ulis: EDP Sciences 2003 S. 149 - 152
Kaulich, Burkhard; Susini, Jean; David, Christian et al.
Twinmic : a European twin microscope station combining full-field imaging and scanning microscopyJournal de Physique IV : Proceedings. Bd. 104. H. 3. Les Ulis: EDP Sciences 2003 S. 103 - 107
Kaulich, Burkhard; Susini, Jean; David, Christian et al.
TwinMic : combined Scanning and Full-field Imaging Microscopy with Novel Contrast MechanismsSRN : Synchrotron Radiation News. Bd. 16. H. 3 : Special Issue " X‐ray Microscopy". Philadelphia, Pa.: Taylor & Francis 2003 S. 49 - 52