Prof. Dr. rer. nat. Thomas Wilhein
FB Mathematik, Informatik, Technik, Hochschule Koblenz
- 02642/932-203
- 02642/932-399
Abbati, Gennaro; Seim, Christian; Legall, Herbert et al.
Preparation of clay mineral samples for high resolution X-ray imagingJournal of Physics : Conference Series. Bd. 463. H. 1. Bristol: Institute of Physics : IOP 2013 012051
Baumbach, Stefan; Wilhein, Thomas
The use of zoneplates for point projection imagingJournal of Physics : Conference Series. Bd. 463. H. 1. Bristol: Institute of Physics : IOP 2013 012014
Wessels, Philipp; Schlie, Moritz; Wieland, Marek et al.
XMCD microscopy with synchronized soft X-ray and laser pulses at PETRA III for time-resolved studiesJournal of Physics : Conference Series. Bd. 463. H. 1. Bristol: Institute of Physics : IOP 2013 012023
Overbuschmann, Johannes; Hengster, Julia; Irsen, Stephan et al.
Fabrication of Fresnel zone plates by ion-beam lithography and application as objective lenses in extreme ultraviolet microscopy at 13 nm wavelengthOptics Letters. Bd. 37. H. 24. Washington, DC: Soc. 2012 S. 5100 - 5102
Lebert, Rainer; Farahzadi, Azadeh; Diete, Wolfgang et al.
Actinic EUV-mask metrology : tools, concepts, componentsBehringer, Uwe F.W. (Hrsg). Proceedings of SPIE : 27th European Mask and Lithography Conference. Bd. 7985. Dresden: SPIE 2011 79850B
Heine, Ruth; Gorniak, Thomas; Nisius, Thomas et al.
Digital in-line X-ray holography with zone platesUltramicroscopy. Bd. 111. H. 8. Amsterdam: Elsevier Science 2011 S. 1131 - 1136
Rosmej, O. N.; Bagnoud, Vincent; Eisenbarth, Udo et al.
Heating of low-density CHO-foam layers by means of soft x-raysNuclear instruments and methods in physics research : Section A ; accelerators, spectrometers, detectors and associated equipment. Bd. 653. H. 1. Amsterdam: North-Holland Publ. Co. 2011 S. 52 - 57
Lenz, Johannes; Krupp, Nikolai; Wilhein, Thomas et al.
Nanofabrication of Optical Elements for SXR and EUV Applications : Ion Beam Lithography as a New ApproachMcNulty, Ian ; Eyberger, Catherine ; Lai, Barry (Hrsg). The 10th International Conference on X-ray Microscopy : Chicago, Illinois, USA ; 15-20 August 2010. Melville, NY: American Institute of Physics 2011 S. 104 - 107
Benk, Markus P.; Bergmann, Klaus; Querejeta-Fernández, A et al.
Soft X‐Ray Microscopic Investigation on Self Assembling NanocrystalsMcNulty, Ian ; Eyberger, Catherine ; Lai, Barry (Hrsg). The 10th International Conference on X-ray Microscopy : Chicago, Illinois, USA ; 15-20 August 2010. Melville, NY: American Institute of Physics 2011 S. 433 - 436
Ewald, Johannes; Wilhein, Thomas
Source Size Characterization of a Microfocus X‐ray Tube Used for In‐Line Phase‐Contrast ImagingMcNulty, Ian ; Eyberger, Catherine ; Lai, Barry (Hrsg). The 10th International Conference on X-ray Microscopy : Chicago, Illinois, USA ; 15-20 August 2010. Melville, NY: American Institute of Physics 2011 S. 81 - 83