Soft Error Tolerance using Horizontal-Vertical- Double-Bit Diagonal parity method
Felix Pasila;Yusak Tanoto;Resmana Lim;Murtiyanto Santoso;Nemuel Daniel Pah (Hrsg). Proceeding of the 2nd International Conference on Electrical Engineering and Infomation Communication Technology iCEEiC 2015: 21 - 23 May 2015; Jahangirnagar University, Savar, Dhaka, Bangladesh. Piscataway, NJ: IEEE Institute of Electrical and Electronics Engineers 2015 S. 1 - 6
Erscheinungsjahr: 2015
ISBN/ISSN: 978-1-4673-6677-9
Publikationstyp: Diverses (Konferenzbeitrag)
Sprache: Englisch
Doi/URN: 10.1109/ICEEICT.2015.7307411
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Autoren
Rahman, Md. Shamimur (Autor)
Sadi, Muhammad Sheikh (Autor)
Ahammed, Sakib (Autor)
