FB Mathematik, Informatik, Technik
Hochschule Koblenz
- 02642/932-300
- 02642/932-301
Weinreich, Ilona
A Wavelet Construction for the two-dimensional SphereAppl. Comput. Harmon. Anal. Bd. 10. 2001 S. 1 - 26
Neuhäuser, Markus
An Adaptive Location-Scale TestBiometrical Journal : clinical trials, epidemiological methods, statistics in life sciences. Bd. 43. H. 7. Weinheim: Wiley-VCH 2001 S. 809 - 819
Fiedler, Armin; Horacek, Helmut
Argumentation in Explanations to Logical ProblemsComputational Science - ICCS 2001, International Conference, San Francisco, CA, USA, May 28-30, 2001. Proceedings, Part I. Berlin: Springer 2001 S. 969 - 978 (Lecture notes in computer science ; 2073)
Hartmann, Ulrich; Lonsdale, Guy; Berti, Guntram et al.
Bio-numerical simulations with SimBio : selected ResultsKeeve, Erwin (Hrsg). Proceedings of the International Workshop on Deformable Modeling and Soft Tissue Simulation. Bonn. 2001 o.A.
Georgescu, Adelina; Vereecken, Harry; Schwarze, Holger et al.
Classes of solutions for a nonlinear diffusion PDEJournal of Computational and Applied Mathematics. Bd. 133. H. 1-2. Amsterdam: Elsevier 2001 S. 373 - 381
Vogt, Ulrich; Wieland, Marek; Wilhein, Thomas et al.
Design and application of a zone plate monochromator for laboratory soft x-ray sourcesReview of Scientific Instruments : RSI. Bd. 72. H. 1. Melville, NY: AIP 2001 S. 53 - 57
Fiedler, Armin
Dialog-driven Adaptation of Explanations of ProofsNebel, Bernhard (Hrsg). Proceedings of the Seventeenth International Joint Conference on Artificial Intelligence, IJCAI 2001, Seattle, Washington, USA, August 4-10. San Francisco, Calif.: Morgan Kaufman 2001 S. 1295 - 1300
Wilhein, Thomas; Kaulich, Burkhard; Di Fabrizio, Enzo et al.
Differential interference contrast x-ray microscopyProceedings of SPIE : Soft X-Ray and EUV Imaging Systems II. Bd. 4506. Bellingham, Wash.: SPIE 2001 S. 163 - 171
Wilhein, Thomas; Kaulich, Burkhard; Di Fabrizio, Enzo et al.
Differential interference contrast x-ray microscopy with submicron resolutionApplied Physics Letters. Bd. 78. H. 14. Melville, NY: AIP 2001 S. 2082 - 2084
Ankerhold, Georg; Buchtal, R.
Diode Laser Spectroscopy for Gas Analysis in Industrial EnvironmentsTechnisches Messen : tm ; Plattform für Methoden, Systeme und Anwendungen der Messtechnik. Bd. 68. H. 9. Berlin: de Gruyter 2001 S. 415 - 423