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FB Mathematik, Informatik, Technik

Hochschule Koblenz

Joseph-Rovan-Allee 2, 53424 Remagen
  • 02642/932-300
  • 02642/932-301
Publikationen
Ergebnisse pro Seite:  10

Weinreich, Ilona

A Wavelet Construction for the two-dimensional Sphere

Appl. Comput. Harmon. Anal. Bd. 10. 2001 S. 1 - 26


Neuhäuser, Markus

An Adaptive Location-Scale Test

Biometrical Journal : clinical trials, epidemiological methods, statistics in life sciences. Bd. 43. H. 7. Weinheim: Wiley-VCH 2001 S. 809 - 819


Fiedler, Armin; Horacek, Helmut

Argumentation in Explanations to Logical Problems

Computational Science - ICCS 2001, International Conference, San Francisco, CA, USA, May 28-30, 2001. Proceedings, Part I. Berlin: Springer 2001 S. 969 - 978 (Lecture notes in computer science ; 2073)


Hartmann, Ulrich; Lonsdale, Guy; Berti, Guntram et al.

Bio-numerical simulations with SimBio : selected Results

Keeve, Erwin (Hrsg). Proceedings of the International Workshop on Deformable Modeling and Soft Tissue Simulation. Bonn. 2001 o.A.


Georgescu, Adelina; Vereecken, Harry; Schwarze, Holger et al.

Classes of solutions for a nonlinear diffusion PDE

Journal of Computational and Applied Mathematics. Bd. 133. H. 1-2. Amsterdam: Elsevier 2001 S. 373 - 381


Vogt, Ulrich; Wieland, Marek; Wilhein, Thomas et al.

Design and application of a zone plate monochromator for laboratory soft x-ray sources

Review of Scientific Instruments : RSI. Bd. 72. H. 1. Melville, NY: AIP 2001 S. 53 - 57


Fiedler, Armin

Dialog-driven Adaptation of Explanations of Proofs

Nebel, Bernhard (Hrsg). Proceedings of the Seventeenth International Joint Conference on Artificial Intelligence, IJCAI 2001, Seattle, Washington, USA, August 4-10. San Francisco, Calif.: Morgan Kaufman 2001 S. 1295 - 1300


Wilhein, Thomas; Kaulich, Burkhard; Di Fabrizio, Enzo et al.

Differential interference contrast x-ray microscopy

Proceedings of SPIE : Soft X-Ray and EUV Imaging Systems II. Bd. 4506. Bellingham, Wash.: SPIE 2001 S. 163 - 171


Wilhein, Thomas; Kaulich, Burkhard; Di Fabrizio, Enzo et al.

Differential interference contrast x-ray microscopy with submicron resolution

Applied Physics Letters. Bd. 78. H. 14. Melville, NY: AIP 2001 S. 2082 - 2084


Ankerhold, Georg; Buchtal, R.

Diode Laser Spectroscopy for Gas Analysis in Industrial Environments

Technisches Messen : tm ; Plattform für Methoden, Systeme und Anwendungen der Messtechnik. Bd. 68. H. 9. Berlin: de Gruyter 2001 S. 415 - 423