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FB Mathematik, Informatik, Technik

Hochschule Koblenz

Joseph-Rovan-Allee 2, 53424 Remagen
  • 02642/932-300
  • 02642/932-301
Publikationen
Ergebnisse pro Seite:  10

Nisius, T.; Andrianov, K.; Haidl, A. et al.

A flexible x-ray imaging endstation for synchrotron radiation facilities

Journal of Instrumentation. Bd. 13. H. 7. London: IOP Publishing 2018 C07004


Welz, Anke; Ruxton, Graeme D.; Neuhäuser, Markus

A non-parametric maximum test for the Behrens–Fisher problem

Journal of Statistical Computation and Simulation : JSCS. Bd. 88. H. 7. Abingdon: Taylor & Francis 2018 S. 1336 - 1347


Haidl, Andreas; Wiesemann, Urs; Andrianov, Konstantin et al.

A Portable Endstation for Analytical X-ray Microscopy Using Soft X-ray Synchrotron Radiation

Microscopy and Microanalysis : the official journal of the Microscopy Society of America. Bd. 24. H. 2. New York, NY: Cambridge University Press 2018 S. 232 - 233


Reich, Simon; Wörgötter, Florentin; Dellen, Babette

A Real-Time Edge-Preserving Denoising Filter

Proceedings of the 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications : Volume 4 ; VISAPP. Funchal, Portugal. 2018 S. 85 - 94


Loetgering, L.; Treffer, D.; Wilhein, T.

Compression and information recovery in ptychography

Journal of Instrumentation. Bd. 13. H. 4. London: IOP Publishing 2018 C04019


Lötgering, Lars; Rose, Max; Keskinbora, Kahraman et al.

Correction of axial position uncertainty and systematic detector errors in ptychographic diffraction imaging

Optical Engineering. Bd. 57. H. 8. Bellingham, Wash.: SPIE 2018 084106


Hönicke, Philipp; Krämer, Markus; Lühl, Lars et al.

Development and characterization of sub-monolayer coatings as novel calibration samples for X-ray spectroscopy

Spectrochimica Acta Part B : Atomic Spectroscopy. Bd. 145. Amsterdam: Elsevier 2018 S. 36 - 42


Dietz, Thomas; Kohns, Peter; Ankerhold, Georg

Diagnostics and simulations of molecular formation in laser-induced plasmas

Spectrochimica Acta : B ; Atomic Spectroscopy. Bd. 148. Amsterdam: Elsevier 2018 S. 51 - 59



Haidl, A.; Andrianov, K.; Nisius, T. et al.

Fast X-ray detection using a CCD for application in a scanning transmission X-ray microscope

Journal of Instrumentation. Bd. 13. H. 6. London: IOP Publishing 2018 C06005