Inhaltszusammenfassung

The measuring routines of a conventional four-circle diffractometer (Stoe) have been modified to allow various scan types in a fully automatic mode. Scan parameters may be entered either as angular (2, , , ) or as hkl values and are given by two ASCII input files. A set of scans in up to four dimensions may be performed. Scans performed with hkl values are based on the orientation matrix of the single-crystal or the matrix of the substrate for the investigations of partially crystallized thin...The measuring routines of a conventional four-circle diffractometer (Stoe) have been modified to allow various scan types in a fully automatic mode. Scan parameters may be entered either as angular (2, , , ) or as hkl values and are given by two ASCII input files. A set of scans in up to four dimensions may be performed. Scans performed with hkl values are based on the orientation matrix of the single-crystal or the matrix of the substrate for the investigations of partially crystallized thin films. The relative orientations of thin films and substrates can be determined.» weiterlesen» einklappen

Autoren

Klassifikation

DFG Fachgebiet:
Physik der kondensierten Materie

DDC Sachgruppe:
Physik