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Gerhard Jakob

Prof. (apl.) Dr. Gerhard Jakob

Johannes Gutenberg-Universität Mainz

Staudinger Weg 7, 55099 Mainz, Raum: 01-430

  • 06131/3924133
  • 06131/3924076
Publikationen
Ergebnisse pro Seite:  10

Miu, L.; Basset, M.; Jakob, Gerhard et al.

Nondiverging vortex pinning barriers at low current densities across the putative elastic vortex-glass-vortex-liquid transition in YBa2Cu3O7-delta films

Physical review B. Bd. 64. H. 22. 2001 S. 220502-1 - 220502-4


Richter, P.; Kreß, M.; Mohler, E. et al.

Optical determination of the oxygen content of YBa2Cu3O6+x thin films by IR reflectance and transmittance measurements

Physica C. Bd. 366. H. 1. 2001 S. 63 - 72


Basset, Michael; Jakob, Gerhard; Wirth, G. et al.

Patterned irradiation of YBa2Cu3O7-x thin films

Physical review B. Bd. 64. 2001 S. 24525 - 24531


Martinez, J. C.; Schattke, A.; Jourdan, Martin et al.

c-axis tunneling in YBa2Cu3O7-δ/PrBa2Cu3O7-δ superlattices

Physical review B. Bd. 61. H. 13. 2000 S. 9162 - 9165


Westerburg, W.; Martin, F.; van Bentum, P. J. M. et al.

Charge carrier density collapse in La0.67Ca0.33MnO3and La0.67Sr0.33MnO3 epitaxial thin films

The European Physical Journal B. Bd. 14. 2000 S. 509 - 513


Westerburg, W.; Reisinger, D.; Jakob, Gerhard

Epitaxy and magnetotransport of Sr2FeMoO6 thin films

Physical review B. Bd. 62. H. 2. 2000 S. R767 - R770


Schwan, Ch.; Martin, F.; Jakob, Gerhard et al.

Ferroelectricity and structure of BaTiO3 grown on YBa2Cu3O7- thin films

The European physical journal / B, condensed matter and complex systems. Bd. 14. 2000 S. 447 - 451


Adrian, Hermann; Jakob, G.; Voss-de Haan, P. et al.

Flux-flow instability and heating effects in Bi2Sr2CaCu2O8 and YBa2Cu3O7 thin films

Physica B. Bd. 284-288. 2000 S. 897 - 898


Pimenov, A.; Loidl, A.; Jakob, Gerhard et al.

Frequency-dependent relaxation rate in superconducting YBa2Cu3O6+δ

Phys. Rev. B. Bd. 61. 2000 S. 7039 - 7043


Westerburg, W.; Martin, F.; Jakob, Gerhard

Hall-effect of epitaxial double perovskite Sr2FeMoO6 thin films

Journal of Applied Physics. Bd. 87. 2000 S. 5040 - 5042