Inhaltszusammenfassung

We present a method to establish a correlation between the crystalline structure and the fluorescence properties of isolated semiconductor nanocrystals. By using ultrathin silicon nitride substrates with markers, we have localized and investigated the same particles in both a high-resolution transmission electron microscope (TEM) and a confocal optical microscope. We have found that the observation of strong fluorescence emission does not require single domain particles. Additionally, we have...We present a method to establish a correlation between the crystalline structure and the fluorescence properties of isolated semiconductor nanocrystals. By using ultrathin silicon nitride substrates with markers, we have localized and investigated the same particles in both a high-resolution transmission electron microscope (TEM) and a confocal optical microscope. We have found that the observation of strong fluorescence emission does not require single domain particles. Additionally, we have correlated the size and shape of a particle as determined by TEM and its spectral properties like emission wavelength and spectral diffusion. (C) 2002 American Institute of Physics. » weiterlesen» einklappen

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