Institut für Physik
Institut für Physik / Johannes Gutenberg-Universität Mainz
- 06131/39-22282
- 06131/39-229 91
Wegelin, F; Krasyuk, A; Elmers, HJ et al.
Stroboscopic XMCD-PEEM imaging of standing and propagating spinwave modes in permalloy thin-film structuresSURFACE SCIENCE. Bd. 601. H. 20. AMSTERDAM: ELSEVIER SCIENCE BV 2007 S. 4694 - 4699
Schneider, Horst; Herbort, Ch.; Jakob, Gerhard et al.
Structural, magnetic and transport properties of Co2FeSi Heusler filmsJournal of physics : D, Applied physics. Bd. 40. H. 6. Bristol: IOP Publ. 2007 S. 1548 - 1551
Jourdan, Martin; Elmers, Hans-Joachim; Adrian, Hermann
Tunneling spectroscopy of the Heusler compound Co2Cr0.6Fe0.1AlJournal of applied physics. Bd. 102. H. 9. Melville, NY: AIP 2007 093710
Miu, L.; Miu, Dana; Jakob, Gerhard et al.
Vortex-system ordering during magnetisation measurements in YBa2Cu3O7−δ films at low temperaturesPhysica C. Bd. 460/462. H. 2. 2007 S. 1206 - 1207
Lin, JQ; Neuhaeusler, U; Slieh, J et al.
Actinic extreme ultraviolet lithography mask blank defect inspection by photoemission electron microscopyJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. Bd. 24. H. 6. MELVILLE: A V S AMER INST PHYSICS 2006 S. 2631 - 2635
Miu, L.; Miu, D.; Jakob, Gerhard et al.
Determination of two-dimensional zero-magnetic-field I-V exponent in Bi2Sr2CaCu2O8+δPhysical review B. Bd. 73. 2006 S. 224526 - 224529
Scheffler, M.; Dressel, M.; Jourdan, Martin et al.
Dynamics of heavy fermions: Drude response in UPd2Al3 and UNi2Al3Physica B: Condensed matter. Bd. 378-380. 2006 S. 993 - 994
Shapran, L; Schope, HJ; Palberg, T
Effective charges along the melting line of colloidal crystalsJOURNAL OF CHEMICAL PHYSICS. Bd. 125. H. 19. 2006
Salem, A.; Jakob, Gerhard; Adrian, Hermann
Mixed-state hall angle and hall conductivity in Hg, re- containing HTSC thin filmsJournal of physics : Conference series. Bd. 43. H. 1. 2006 S. 259 - 262
Schonhense, G; Elmers, HJ
PEEM with high time resolution - imaging of transient processes and novel concepts of chromatic and spherical aberration correctionSURFACE AND INTERFACE ANALYSIS. Bd. 38. H. 12-13. CHICHESTER: JOHN WILEY & SONS LTD 2006 S. 1578 - 1587