PEEM with high time resolution - imaging of transient processes and novel concepts of chromatic and spherical aberration correction
SURFACE AND INTERFACE ANALYSIS. Bd. 38. H. 12-13. CHICHESTER: JOHN WILEY & SONS LTD 2006 S. 1578 - 1587
Erscheinungsjahr: 2006
Publikationstyp: Zeitschriftenaufsatz
Doi/URN: 10.1002/sia.2433
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