Inhaltszusammenfassung

By DC-sputtering from a stoichiometric target onto sapphire substrates we prepared epitaxial films of Ni2MnGa. X-ray diffraction in two circle geometry shows only the Ni2MnGa peaks corresponding to a (1 1 0) oriented growth on the (1 1 0) oriented sapphire substrate. Rocking curve scans shows that the out of plane orientation has a width of only 1.1. By four circle X-ray diffraction we find an in-plane aligned growth. The Curie temperature as determined by SQUID magnetometry is 368 K. On cool...By DC-sputtering from a stoichiometric target onto sapphire substrates we prepared epitaxial films of Ni2MnGa. X-ray diffraction in two circle geometry shows only the Ni2MnGa peaks corresponding to a (1 1 0) oriented growth on the (1 1 0) oriented sapphire substrate. Rocking curve scans shows that the out of plane orientation has a width of only 1.1. By four circle X-ray diffraction we find an in-plane aligned growth. The Curie temperature as determined by SQUID magnetometry is 368 K. On cooling down the low field magnetization drops at around 260?280 K indicating the austenite to martensite transition. The presence of two different phases at high and low temperature also shows up in temperature-dependent X-ray measurements. The element specific magnetic moments for thin film samples have been determined by magnetic circular X-ray dichroism (XMCD) measurements. » weiterlesen» einklappen

Autoren

Klassifikation

DFG Fachgebiet:
Physik der kondensierten Materie

DDC Sachgruppe:
Physik